A. Rastelli, M. Stoffel, et al.
Microelectronics Journal
Paper
Instability wavelength in strained-alloy epitaxy
Abstract
No abstract available.
Related
F.K. LeGoues, P.M. Mooney, et al.
Physical Review Letters
Yuhai Tu, J. Tersoff
Physical Review Letters
S. Kodambaka, J. Tersoff, et al.
Microscopy and Microanalysis