PaperSummary Abstract: Multilayer thin films for x-ray opticsEberhard SpillerJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Conference paperEnhancement of the reflectivity of multilayer x-ray mirrors by ion polishingEberhard SpillerProceedings of SPIE 1989
Conference paperImaging performance of a normal incidence x-ray telescope measured at 0.18 kevJ.P. Henry, Eberhard Spiller, et al.Proceedings of SPIE 1989
