Conference paperNEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.S. Cohen, T.O. Sedgwick, et al.MRS Proceedings 1983
PaperHoles trapped near Mg2+ and Al3+ impurities in SrTiO3O.F. Schirmer, W. Berlinger, et al.Solid State Communications
PaperRadical polymerization of N‐phenyl‐α‐methylene‐β‐lactamMitsuru Ueda, Hideharu Mori, et al.Journal of Polymer Science Part A: Polymer Chemistry
PaperAF-Net: An Active Fire Detection Model Using Improved Object-Contextual Representations on Unbalanced UAV DatasetsXikun Hu, Wenlin Liu, et al.IEEE J-STARS
