Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
The magnetization measurement on the nanometer scale was discussed. The magnetic tip of a magnetic force microscope within the point-probe approximation was calibrated. The calibration was proved for determining quantitatively a hysteresis loop for the single magnetic dot with perpendicular magnetic anisotropy.
T.N. Morgan
Semiconductor Science and Technology
Ming L. Yu
Physical Review B
K.N. Tu
Materials Science and Engineering: A
Ellen J. Yoffa, David Adler
Physical Review B