Conference paperA simple array-based test structure for the AC variability characterization of MOSFETsKarthik Balakrishnan, Keith A. Jenkins, et al.ISQED 2011
PaperRF circuit design aspects of spiral inductors on siliconJoachim N. Burghartz, D. Edelstein, et al.IEEE Journal of Solid-State Circuits
PaperMicrowave inductors and capacitors in standard multilevel interconnect silicon technologyJoachim N. Burghartz, Mehmet Soyuer, et al.IEEE T-MTT
Conference paperAn on-chip jitter measurement circuit with sub-picosecond resolutionKeith A. Jenkins, Anup P. Jose, et al.ESSCIRC 2005
