Mehmet Soyuer, Joachim N. Burghartz, et al.
IEEE Journal of Solid-State Circuits
Paper
Measurement of VLSI Power Supply Current by Electron-Beam Probing
Abstract
The measurement of power supply noise and current by electron-beam probing is described. Noise measurements can be made on the chip under test, and current measurements can be made on the circuit board. © 1992 IEEE
Related
Keith A. Jenkins, Woogeun Rhee, et al.
SiRF 2006
James Warnock, John D. Cressler, et al.
IEEE Electron Device Letters
Conference paper
On-chip circuit for measuring multi-GHz clock signal waveforms
Keith A. Jenkins, P. Restle, et al.
VTS 2013