Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
An infrared temperature measurement system was used to measure hot spots in a magnetic head rigid disk interface. The system employed the spectral distribution as well as intensity of sampled radiation to determine both the temperature and effective area of microscopic sources at elevated temperature. Flash temperatures between particulate and thin-film rigid disks and a simulated transparent sapphire slider at various operating conditions were measured. © 1991 by ASME.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Joseph S. Logan, James J. McGill
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
W.C. Reynolds, R. Jayaraman
Journal of Fluid Mechanics
M.F. Crommie, C. Lutz, et al.
Surface Science