Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops

Keith A. Jenkins; James P. Eckhardt

doi:10.1109/54.844337

IEEE Design and Test of Computers

Paper

01 Apr 2000

Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops

View publication

Abstract

Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured - not just the jitter.

Paper

Effective crosstalk isolation through p⁺ Si substrates with semi-insulating porous Si

Han-Su Kim, Keith A. Jenkins, et al.

IEEE Electron Device Letters

Paper

Graphene radio frequency devices on flexible substrate

Wenjuan Zhu, Damon B. Farmer, et al.

Applied Physics Letters

Conference paper

RF performance of short channel graphene field-effect transistor

Yanqing Wu, Yu-Ming Lin, et al.

IEDM 2010

Paper

Low-voltage transient bipolar effect induced by dynamic floating-body charging in scaled PD/SOI MOSFET's

Mario M. Pelella, Jerry G. Fossum, et al.

IEEE Electron Device Letters

View all publications

Abstract

Related

Effective crosstalk isolation through p+ Si substrates with semi-insulating porous Si

Graphene radio frequency devices on flexible substrate

RF performance of short channel graphene field-effect transistor

Low-voltage transient bipolar effect induced by dynamic floating-body charging in scaled PD/SOI MOSFET's

Effective crosstalk isolation through p⁺ Si substrates with semi-insulating porous Si