Conference paperAn Aberration Corrected Photoemission Electron Microscope at the Advanced Light SourceJ. Feng, A.A. MacDowell, et al.SYNCHROTRON RADIATION INSTRUMENTATION 2003
PaperExploring the microscopic origin of exchange bias with photoelectron emission microscopy (invited)A. Scholl, F. Nolting, et al.Journal of Applied Physics
PaperDirect observation of the alignment of ferromagnetic spins by antiferromagnetic spinsF. Nolting, A. Scholl, et al.Nature
PaperAn x-ray photoemission electron microscope using an electron mirror aberration corrector for the study of complex materialsJ. Feng, E. Forest, et al.Journal of Physics Condensed Matter
