J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Michiel Sprik
Journal of Physics Condensed Matter
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films