R.W. Gammon, E. Courtens, et al.
Physical Review B
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
R.W. Gammon, E. Courtens, et al.
Physical Review B
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science