Conference paper
System-level SRAM yield enhancement
Fadi J. Kurdahi, Ahmed M. Eltawil, et al.
ISQED 2006
Power grids for sub-micron large integrated circuits are performance limiting factors due to the large power dissipated (e.g. 100 W at 1.8 V). The analysis of such power grids is important in order to predict and possibly improve the performance. Current classical analysis methods are falling behind as grids become ever larger. This paper proposes a new efficient analysis method suitable for both DC and transient simulation of large power grids.
Fadi J. Kurdahi, Ahmed M. Eltawil, et al.
ISQED 2006
Juan-Antonio Carballo, Sani R. Nassif
IEEE Design and Test of Computers
Kerry Bernstein, David J. Frank, et al.
IBM J. Res. Dev
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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems