Detlev A. Grützmacher, Thomas O. Sedgwick, et al.
SPIE Physical Concepts of Materials for Novel Optoelectronic Device Applications 1993
Multilayer AI20s-Si02combination (MASe) films are shown to be superior to 8i02films for Ge surface passivation during a forming-gas annealing cycle. The Ahos is apparently much less permeable to H2 than is Si02• Hydrogen easily permeates 8i02, producing a high density of surface acceptor states on the Ge. Even in the absence of hydrogen exposure, the surface-state and fixed-charge densities under MASC films are reduced by a factor of 2 or more as compared to pyrolytic Si02 films. Copyright © 1969 by The Institute of Electrical and Electronics Engineers, Inc.
Detlev A. Grützmacher, Thomas O. Sedgwick, et al.
SPIE Physical Concepts of Materials for Novel Optoelectronic Device Applications 1993
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IEEE T-ED
Joachim N. Burghartz, Keith A. Jenkins, et al.
IEEE Electron Device Letters
Paul D. Agnello, Thomas O. Sedgwick
JES