R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
It is shown that band structure effects give a small but not negligible contribution to the transverse cyclotron mass enhancement in silicon [100] field effect transistor devices. For carrier concentrations of about 8 × 1012 electrons per cm2 the mass increases by approximately Δm* = 0.005, i.e. 2.4%. In opposition to the many-body corrections, the band structure enhancement increases with concentration. © 1976.
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990