J.M. White, P.F. Heidrich, et al.
Electronics Letters
A new and sensitive measurement technique of determining elastic properties of a thin film on a substrate based on harmonic generation of dispersive Rayleigh waves is demonstrated. The technique has a sensitivity of detecting a change of 0.001% in velocity due to the loading of the thin film. A damaged layer of about 20 Å on a mechanically polished LiNbO3 substrate is detectable. © 1971 The American Institute of Physics.
J.M. White, P.F. Heidrich, et al.
Electronics Letters
E.G. Lean, C.C. Tseng
Journal of Applied Physics
P. Zory, C.G. Powell
Applied Optics
E.G. Lean
ISSCC 1972