Conference paper
True 3-D displays for avionics and mission crewstations
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
We present the normal-state resistance of La2-xSrxCuO4 thin films under epitaxial strain, measured below Tc by applying pulsed fields up to 60 T. We compare these data with earlier data on YBa2Cu3Ox thin films in the underdoped regime. The data are analyzed in terms of the recently proposed ID quantum transport model and charge-stripe models. The high field data have been used to identify the new regimes and dimensional crossovers caused by the formation of stripes and their interplay with disorder. © 2000 Elsevier Science B. V. All rights reserved.
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Robert W. Keyes
Physical Review B
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000