A. Gangulee, F.M. D'Heurle
Thin Solid Films
An unusual frequency-dependence of the resistivity for ∼ 2.5 Å of Pd on Si(111) is determined by electron energy loss spectroscopy and analyzed using the Bruggeman effective medium theory. This analysis together with hydrogen titration studies indicate a microstructure having small ({less-than or approximate} 7 A ̊) metallic clusters embedded in the Si surface. We also show that electron tunnelling via surface states gives an important contribution to the d.c. conductivity of such metallic films. © 1985.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
Robert W. Keyes
Physical Review B