Nabil M. Amer
Proceedings of SPIE 1989
Paper
Novel optical approach to atomic force microscopy
Abstract
A sensitive and simple optical method for detecting the cantilever deflection in atomic force microscopy is described. The method was incorporated in an atomic force microscope, and imaging and force measurements, in ultrahigh vacuum, were successfully performed.
Related
Leo Gross, Bruno Schuler, et al.
Angewandte Chemie - International Edition
Leo Gross, Fabian Mohn, et al.
Science
Wolfram Steurer, Bruno Schuler, et al.
Nano Letters