A.N. Broers, E.G. Lean, et al.
Applied Physics Letters
Images of Fresnel fringes have been obtained in the conventional surface scanning electron microscope operating in the transmission mode. These fringes provide a means for critically evaluating instrument resolution, final lens astigmatism, and source brightness. © 1972 The American Institute of Physics.
A.N. Broers, E.G. Lean, et al.
Applied Physics Letters
A.N. Broers, W. Molzen, et al.
Applied Physics Letters
R.F. Voss, R.B. Laibowitz, et al.
IEEE Transactions on Magnetics
A.N. Broers, M. Pomerantz
Thin Solid Films