Soft x-ray diffraction of striated muscle
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
A diffusion constant for electrons in a current-carrying semiconductor can be unambiguously defined in nearly uniform systems. For frequency-dependent density gradients it is {Mathematical expression} where {Mathematical expression} is the velocity correlation function with respect to the steady state in a bias field. This result has been elucidated in the relaxation approximation by different approaches to the diffusion problem. Essential for its derivation is a statistical independence assumption of space and velocities, and in order to get a classical diffusion law of Fick's type certain velocities have to be distributed according to the steady state in a bias field. Diffusion constant and noise temperature are discussed for a few band structures in the relaxation approximation. © 1971 Springer-Verlag.
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Sung Ho Kim, Oun-Ho Park, et al.
Small
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications
Peter J. Price
Surface Science