Conference paper
Convergence properties of multi-dimensional stack filters
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
No abstract available.
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
Shu Tezuka
WSC 1991
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence