A.C. Tam, B. Sullivan
Applied Physics Letters
Paper
OPTICAL DETECTION OF PHOTOACOUSTIC PULSES IN THIN SILICON WAFERS.
Abstract
The propagation of photoacoustic pulses in thin silicon wafers is studied by a probe-beam deflection method. A comparison with transducer measurements is made, which suggests the existence of a nonpropagating plate mode. A signal-to-noise analysis is carried out, and the sensitivity of this detection scheme is analyzed for the case of high-frequency broad-band detection.
Related
W.P. Leung, A.C. Tam
Journal of Applied Physics
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Holger Schroeder, A.C. Tam
Topical Meeting on Lasers in Materials Diagnostics 1986