O.C. Wells, P. Coane, et al.
Microbeam Analysis 1982
Paper
Penetration effect at sharp edges in the scanning electron microscope
Abstract
No abstract available.
Related
O.C. Wells, R.J. Savoy
Scanning
O.C. Wells, C.F. Aliotta
Scanning
L. Gignac, S.H. Boettcher, et al.
M&M 2006