F.M. D'Heurle, P. Gas, et al.
Defect and Diffusion Forum
The influence of target texture on the backscattering yield of 2 MeV 4He particles has been investigated for evaported thin-film targets of Nb, Ag, Au and Bi. The results have been correlated with those from X-ray diffraction. The implications of the texture found for nuclear-backscattering analysis are discussed, and it is suggested that backscattering may constitute a fast, quantitative method for investigations of texture in thin foils. © 1978.
F.M. D'Heurle, P. Gas, et al.
Defect and Diffusion Forum
Raúl Fernández Díaz, Lam Thanh Hoang, et al.
ICLR 2025
Aurélien Pélissier, Youcef Akrout, et al.
Cells
S.B. Newcomb, K.N. Tu
Applied Physics Letters