S.B. Newcomb, K.N. Tu
Applied Physics Letters
The influence of target texture on the backscattering yield of 2 MeV 4He particles has been investigated for evaported thin-film targets of Nb, Ag, Au and Bi. The results have been correlated with those from X-ray diffraction. The implications of the texture found for nuclear-backscattering analysis are discussed, and it is suggested that backscattering may constitute a fast, quantitative method for investigations of texture in thin foils. © 1978.
S.B. Newcomb, K.N. Tu
Applied Physics Letters
MingYu Lu, Zachary Shahn, et al.
AMIA ... Annual Symposium proceedings. AMIA Symposium
K.N. Tu
Materials Science and Engineering: A
Uri Kartoun, Kingsley Njoku, et al.
AMIA ... Annual Symposium proceedings. AMIA Symposium