PaperA determination of the thermal expansion of pure Ge and a measurement of the differential thermal expansion of a GeSingle Bond signGaAs thin-layer coupleR. Feder, T.B. LightJournal of Applied Physics
PaperAccommodation of misfit across the interface between crystals of semiconducting elements or compoundsJ.W. Matthews, S. Mader, et al.Journal of Applied Physics
PaperStructure of thin lead oxide layers as determined by x-ray diffractionT.B. Light, J.M. Eldridge, et al.Journal of Applied Physics
PaperDilatometric and x-ray thermal expansion in noncubic crystals. I. Role of dislocation climbA.S. Nowick, R. FederPhysical Review B
