Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
State-of-the-art resist for 193 nm lithography are analyzed with respect to possible resolution, photospeed and etch resistance. This paper describes this photoresist design study and emphasizes the many opportunities and challenges that the photoresist and semiconductor industry face with the unfolding of this technology.
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
Sung Ho Kim, Oun-Ho Park, et al.
Small
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
Peter J. Price
Surface Science