V. Narayanan, V.K. Paruchuri, et al.
VLSI Technology 2006
A brief description of a Wien filter energy-loss spectrometer design for the STEM is given. The performance limit of the device is about 80 meV resolution at 1 mrad semi-angle. At a 12.5 mrad semi-angle referred to the specimen, the total system delivers 0.35 eV resolution, limited mainly by the field emission tunneling width. Various experimental results are compared to results from other spectrometers. © 1985.
V. Narayanan, V.K. Paruchuri, et al.
VLSI Technology 2006
C.Y. Wong, C.R.M. Grovenor, et al.
Journal of Applied Physics
P.E. Batson, J.R. Heath
Physical Review Letters
P.E. Batson, M.F. Chisholm
Journal of Electron Microscopy Technique