Cr migration on 193nm binary photomasks
John Bruley, Geoffrey Burr, et al.
SPIE Advanced Lithography 2009
Carbon thin films have been prepared by 248 nm excimer laser vaporization of graphite targets. The effect of a variety of process parameters on the film properties is investigated. Deposition at or below room temperature yields diamond-like films with low hydrogen content, high optical transmission, and high resistivity. Electron energy loss spectra indicate sp3 bond fractions of 70-85%. Detailed analyses of the pseudodielectric functions, measured using spectroscopic ellipsometry, show the films to have normal dispersion and an index of refraction of 2.5 in the visible wavelength region. The effects of a low pressure hydrogen background and the use of auxiliary pulsed and dc plasma enhancements are also examined.
John Bruley, Geoffrey Burr, et al.
SPIE Advanced Lithography 2009
Catherine Dubourdieu, E. Cartier, et al.
Applied Physics Letters
Jeng-Bang Yau, Jin Cai, et al.
VLSI-TSA 2009
Hiroaki Arimura, Stephen L. Brown, et al.
IEEE Electron Device Letters