A. Krol, C.J. Sher, et al.
Surface Science
We have used photoluminescence from nonequilibrium electrons recombining at neutral acceptors to quantitatively measure hot electron kinetics in GaAs. Values have been obtained for intervalley scattering rates as a function of electron kinetic energy and the scattering rate of a single nonequilibrium electron in the presence of a sea of thermalized carriers. These measurements demonstrate the power of this new probe of nonequilibrium carrier relaxation in direct gap semiconductors. © 1989.
A. Krol, C.J. Sher, et al.
Surface Science
Revanth Kodoru, Atanu Saha, et al.
arXiv
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
K.N. Tu
Materials Science and Engineering: A