J. Freeouf, J.C. Tsang, et al.
Physical Review Letters
The dependence of the crystalline structure of porous Si on the bonding of surface Si atoms to either H or O has been studied by Raman spectroscopy. H terminated porous Si shows microcrystalline character while O terminated porous Si shows atomic disorder within the Si particles.
J. Freeouf, J.C. Tsang, et al.
Physical Review Letters
R.T. Collins, K.V. Klitzing, et al.
Physical Review B
D.B. Beach, R.T. Collins, et al.
MRS Proceedings 1992
J.A. Kash, J.C. Tsang, et al.
CICC 1997