H.-S. Wong, David J. Franks, et al.
IEDM 1998
Periodic structure is observed in the current-voltage characteristics at 4.2 K of n-GaAs-AlxGa1-xAs-n+GaAs capacitors, grown by molecular beam epitaxy, which have AlxGa 1-xAs thicknesses of 30-35 nm. The periodicities can be explained quantitatively by the theory of resonant Fowler-Nordheim tunneling.
H.-S. Wong, David J. Franks, et al.
IEDM 1998
G.M. Cohen, M.J. Rooks, et al.
Applied Physics Letters
P. Solomon, D.J. Frank, et al.
IEEE T-ED
J. Klem, T.J. Drummond, et al.
Journal of Electronic Materials