S.C. Wu, S.H. Lu, et al.
Physical Review B
Paper
Sample holder for diffraction and other studies in ultrahigh vacuum
Abstract
A sample holder suitable for ultrahigh vacuum experimentation is described that allows, in addition to translation and tilting, rotation of the sample around two mutually perpendicular axes. © 1969 The American Institute of Physics.
Related
A.M. Begley, S.K. Kim, et al.
Physical Review B
P.M. Marcus, F. Jona, et al.
Surface Science
T. Sokolov, F. Jona, et al.
EPL