D.W. Jepsen, P.M. Marcus, et al.
Physical Review Letters
Paper
Sample holder for diffraction and other studies in ultrahigh vacuum
Abstract
A sample holder suitable for ultrahigh vacuum experimentation is described that allows, in addition to translation and tilting, rotation of the sample around two mutually perpendicular axes. © 1969 The American Institute of Physics.
Related
F. Jona, P.M. Marcus
Surface Science
F. Jona, H.R. Wendt
Journal of Applied Physics
A. Ignatiev, F. Jona, et al.
Physical Review B