Peter Pleshko, Eugene S. Schlig, et al.
IEEE JSSC
The scanning limitations of rms-responding liquid-crystal devices as influenced by device characteristics, the type of matrix addressing scheme, and waveform tolerances are quantified in this paper. An rms selection scheme that yields a greater number of scanned lines than a 3:1 selection scheme is presented and analyzed, together with a two-frequency addressing scheme that overcomes limitations on scanning associated with the cutoff frequency for dynamic-scattering. Dynamic-scattering liquid-crystal displays are the main emphasis of this paper. However, many of the results apply to field-effect liquid-crystal displays. Copyright © 1974 by The Institute of Electrical and Electronics Engineers, Inc.
Peter Pleshko, Eugene S. Schlig, et al.
IEEE JSSC
Paul M. Alt, M.J. Freiser
Journal of Applied Physics
Peter Pleshko, István Palócz
Physical Review Letters
Paul M. Alt
IEEE Micro