PaperElectromigration in two-level interconnect structures with Al alloy lines and W studsC.-K. Hu, P.S. Ho, et al.Journal of Applied Physics
PaperCharging effects in the secondary ion mass spectrometric analysis of targets containing low-conductivity regionsW. Reuter, M.L. Yu, et al.Journal of Applied Physics
PaperCorrelated DLTS and EPR measurements of defects in As-grown and electron irradiated p-type GaPP.M. Mooney, T.A. Kennedy, et al.Physica B+C
PaperThe Dissolution Kinetics of GaAs in Undersaturated Isothermal Solutions in the Ga-Al-As SystemM.B. Small, R. Ghez, et al.JES
