STT-MRAM with double magnetic tunnel junctions
Guohan Hu, J.H. Lee, et al.
IEDM 2015
Using site controlled growth of single vapor-liquid-solid silicon nanowires high aspect ratio atomic force microscope probes are fabricated on a wafer scale. Nanowire probe aspect ratios as high as 90:1 are demonstrated. Probe performance and limitations are explored by imaging high aspect ratio etched silicon structures using atomic force microscopy. Silicon nanowire probes are an ideal platform for non-destructive topographic imaging of high aspect ratio features. © 2012 American Institute of Physics.
Guohan Hu, J.H. Lee, et al.
IEDM 2015
Muhammad Shahid, Nulati Yesibolati, et al.
Journal of Power Sources
Federico Panciera, Yi-Chia Chou, et al.
Nature Materials
Maria Gherasimova, See Wee Chee, et al.
International Journal of High Speed Electronics and Systems