G.A. Sai-Halasz, M.R. Wordeman, et al.
IEDM 1986
We report on an annealing process which controls the stress in SOS. By laser power inputs of various durations, we regrow the Si on a compressed sapphire surface. The room temperature stress in Si correlates with the time scale of the annealing process. The effect can be understood in terms of thermal stress at the sapphire surface.
G.A. Sai-Halasz, M.R. Wordeman, et al.
IEDM 1986
A. Zaslavsky, D.A. Grützmacher, et al.
Surface Science
Ch. Simon, B.B. Goldberg, et al.
Physical Review B
C.M. Wu, E.S. Yang, et al.
Journal of Applied Physics