Structure of ultrathin films of Fe on Cu{111} and Cu{110}

A study of the growth of Fe on Cu{111} and on Cu{110} has been carried out with low-energy electron diffraction (LEED) and Auger electron spectroscopy. We find that on Cu{111}, Fe grows first pseudomorphically as -Fe{111} to a thickness of about five layer equivalents (LE), and then forms six bcc Fe{110} domains rotationally related in the Kurdjumov-Sachs orientation. The pseudomorphic film has the same bulk interlayer spacing, within experimental error, as the Cu{111} substrate (2.080.03 AIS) and a slightly contracted first interlayer spacing (2.030.03 AIS). With increasing thickness more and more defects are introduced in the film, but a 13-LE film still produces a good LEED pattern. On Cu{110}, the Fe film grows also pseudomorphically, with the same bulk interlayer spacing as the substrate (1.27 AIS) and a contracted first interlayer spacing (1.17 AIS), but a precise structure analysis is not possible because the film has relatively large {111} facets. Defects and disorder increase with film thickness, so that the LEED pattern is practically obliterated when the thickness exceeds about 20 LE. © 1992 The American Physical Society.