PaperBackscattered electron imaging in the scanning electron microscope: The use of either: (A) high incident energy or (b) an array detectorL. Gignac, O.C. Wells, et al.Microscopy and Microanalysis
Conference paperImaging at high beam energies in the scanning electron microscopeL. Gignac, S.H. Boettcher, et al.M&M 2006
PaperElectromigration of Ni in Al thin-film conductorsF.M. D'Heurle, A. Gangulee, et al.Journal of Applied Physics
PaperMethod for examining solid specimens with improved resolution in the scanning electron microscope (SEM)O.C. Wells, A.N. Broers, et al.Applied Physics Letters
