Joerg Appenzeller, Yu-Ming Lin, et al.
IEEE Transactions on Electron Devices
We present output and transfer characteristics of single-gated, 36 nm, 46 nm and 56 nm channel length SOI MOSFETs with a V-groove design. For the shortest devices we find transconductances as high as 900 μS/μm and drive currents of 490 μA/μm at Vgs - Vth = 0.6 V. The V-groove approach combines the advantages of a controlled, extremely abrupt doping profile between the highly doped source/drain and the undoped channel region with an excellent suppression of short-channel effects. In addition, our V-groove design has the potential of synthesizing devices in the 10 nm range.
Joerg Appenzeller, Yu-Ming Lin, et al.
IEEE Transactions on Electron Devices
Dionisis Berdebes, Tony Low, et al.
IEEE T-ED
J.E. Demuth, D. Schmeisser, et al.
Physical Review Letters
H.C. Akpati, P. Nordlander, et al.
Surface Science