P. Lindenfeld, H. Rohrer
Physical Review
We discuss the potential of a new technique for surface imaging on an atomic scale: scanning tunneling microscopy. Examples for 3D topographies of surfaces and work-function profiles are given. © 1983.
P. Lindenfeld, H. Rohrer
Physical Review
O. Marti, G. Binnig, et al.
Surface Science
P. Mächtle, R. Berger, et al.
Proceedings of the IEEE Micro Electro Mechanical Systems (MEMS)
F.J. Giessibl, G. Binnig
Ultramicroscopy