Xudong Weng, Peter Rez, et al.
Solid State Communications
This paper reports a study of surface plasmon excitation on the flat, oxide-covered aluminum surface, using high energy electrons which pass the surface at a finite, and sometimes large, impact parameter. The scattering probability dependence on impact parameter agrees qualitatively with classical, quasi-static calculations, which assume that the materials are characterized by homogeneous dielectric constants. A broad intensity maximum near 16 eV is identified as a surface plasmon made possible by the frequency dependence of the aluminum oxide dielectric constant. © 1983.
Xudong Weng, Peter Rez, et al.
Solid State Communications
P.E. Batson
Microscopy of Semiconducting Materials 1991
A.C. Callegari, K. Babich, et al.
ECS Meeting 2007
P.E. Batson, D.W. Johnson, et al.
Ultramicroscopy