R.W. Gammon, E. Courtens, et al.
Physical Review B
In situ evaporated polycrystalline Yb films at different substrate temperatures (10<T<∼300 K) were studied by surface-sensitive photoemission (h =40.8 eV). The presence of substrcture in the surface-derived 4f13 components allowed an identification of multiple surface shifts as being due to different coordination numbers of surface atoms. The temperature- dependent intensity variation of the surface emission could be correlated with the temperature-dependent change of the surface microstructure. © 1983 The American Physical Society.
R.W. Gammon, E. Courtens, et al.
Physical Review B
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
A. Gangulee, F.M. D'Heurle
Thin Solid Films