S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
The capability of atomic-force microscopy (AFM) to localize both individual adsorbates and aggregates of adsorbed molecules was demonstrated a few years ago. More recently submonolayers of fullerene molecules deposited on a gold substrate have been imaged using such devices. In this paper, simulations of the atomic force between a thin probe tip and a set of adsorbed molecules is presented. The long-range part of the interaction is determined from a whole self-consistent procedure in which many-body effects are accounted for at all orders. In this description the probe tip interacts with the molecules and the surface through many-body dispersion forces. Short-range interactions are then included by using an atom-atom semiempirical pairwise potential. Simulations of AFM images of C60 adsorbed molecules are presented in two different modes of imaging: the constant-tip-height mode and the constant-force mode. © 1993 The American Physical Society.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
T.N. Morgan
Semiconductor Science and Technology
Ellen J. Yoffa, David Adler
Physical Review B