David W. Abraham, Y. Lu
Journal of Applied Physics
A model is presented for magnetic force microscope (MFM) images obtained with a ferromagnetic tip and a ferromagnetic sample. Results of calculations are compared to recent MFM experiments and show good agreement using known values for magnetic parameters characterizing tip and sample. The model describes a limit in resolution determined by the demagnetizing effect of tip and sample, predicts the appearance of a novel image artifact which is particularly observable in images of narrow domains of reversed magnetization, and suggests an explanation for the observed contrast between regions of opposite magnetization.
David W. Abraham, Y. Lu
Journal of Applied Physics
F. Alan McDonald
Applied Physics Letters
Zhancheng Yao, Martin Sandberg, et al.
APS March Meeting 2024
D.C. Worledge, M. Gajek, et al.
IMW 2012