J.R. Lloyd, R.H. Koch
Journal of Applied Physics
Time-resolved measurements of spin-transfer-induced (STI) magnetization reversal were made in current-perpendicular spin-valve nanomagnetic junctions subject to a pulsed current bias. These results can be understood within the framework of a Landau-Lifshitz-Gilbert equation that includes STI corrections and a Langevin random field for finite temperature. Comparison of these measurements with model calculations demonstrates that spin-transfer induced excitation is responsible for the observed magnetic reversal in these samples. © 2004 The American Physical Society.
J.R. Lloyd, R.H. Koch
Journal of Applied Physics
F.P. Milliken, S.L. Brown, et al.
Applied Physics Letters
J.A. Katine, M.K. Ho, et al.
INTERMAG 2003
R.P. Robertazzi, A.W. Kleinsasser, et al.
Physical Review B