Philip A. Saunders, J.F. Ziegler
Nuclear Instruments and Methods In Physics Research
We have evaluated the trace-element sensitivty of ion-induced x-ray analysis on residues from water samples using 700-keV protons. We find that most elements of interest can be detected in quantities below one part per billion in running times of about 3 min. We discuss in detail the necessary steps for absolute calibration of the analysis system, and the process of sample preparation in countries where high-purity substrates are difficult to obtain.
Philip A. Saunders, J.F. Ziegler
Nuclear Instruments and Methods In Physics Research
W.K. Chu, B.L. Crowder, et al.
Applied Physics Letters
J.F. Ziegler
Journal of Applied Physics
J.E.E. Baglin, J.F. Ziegler
Journal of Applied Physics