J. Yu, U. Ruediger, et al.
Journal of Applied Physics
Paper
Transmission electron microscopy observations of magnetic multilayers
Abstract
Transmission electron microscopy has been used for structural characterization of magnetic multilayers of particular interest because of their coupling behavior and giant magnetoresistance. Some case studies of multilayers, grown by DC magnetron sputtering, are presented and discussed. These include examples from the Co/Cu, NiFe/Cu and Fe/Co systems. © 1992.
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