Conference paper
Full metal gate with borderless contact for 14 nm and beyond
Soon-Cheon Seo, L.F. Edge, et al.
VLSI Technology 2011
A study was conducted on thermally driven D and H transport and exchange in typical metal-oxide-semiconductor (MOS) device structures. As such, D and H were quantified and profiled by elastic recoil detection (ERD), which was superior to SIMS in the accuracy of total amounts but showed limited depth resolution. The results clearly show that poly-Si and borophosphosilicate glass (BPSG) were effective in transporting hydrogenous species at rather low temperature.
Soon-Cheon Seo, L.F. Edge, et al.
VLSI Technology 2011
M. Copel, E. Cartier, et al.
Applied Physics Letters
D.A. Buchanan, E. Gusev, et al.
IEDM 2000
L. Pantisano, L. Lucci, et al.
IEEE Electron Device Letters