Joachim N. Burghartz, Siegfried R. Mader, et al.
IEEE T-ED
Over the period of the past five years, major advances in techniques for the low-temperature preparation of epitaxial films in the silicon!germanium materials system have led to remarkable progress in silicon-based device technology. The fundamental chemical principles underlying one of these growth methods, ultrahigh vacuum/chemical vapor deposition (UHV/CVD), are described in this overview. A variety of unique devices and structures, for example high-speed graded bandgap heterojunction bipolar transistors and n-type resonant tunneling diodes, will be discussed. The role of fundamental interface chemistry in making such structures possible will also be considered. © 1992 IEEE.
Joachim N. Burghartz, Siegfried R. Mader, et al.
IEEE T-ED
Bernard S. Meyerson, Joseph M. Jasinski
Journal of Applied Physics
Johannes M. C. Stork, David L. Harame, et al.
IEEE T-ED
Maurizio Arienzo, Subramanian S. Iyer, et al.
Applied Surface Science