Conference paper
The resilience wall: Cross-layer solution strategies
Subhasish Mitra, Pradip Bose, et al.
VLSI-TSA 2014
New alpha counters make accurate measurements of low emissivity samples possible. Modeling results set lower limits for measurements at sea level of silicon substrates to about 0.3α khr-cm2. Our measurements demonstrate the effect of cosmic ray shielding on the measured alpha-particle emissivity. A few atoms of radon contamination can cause elevated emissivities many days after exposure. © 1963-2012 IEEE.
Subhasish Mitra, Pradip Bose, et al.
VLSI-TSA 2014
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