Conference paper
SRAM SER in 90, 130 and 180 NM bulk and SOI technologies
Ethan H. Cannon, Daniel D. Reinhardt, et al.
IRPS 2004
New alpha counters make accurate measurements of low emissivity samples possible. Modeling results set lower limits for measurements at sea level of silicon substrates to about 0.3α khr-cm2. Our measurements demonstrate the effect of cosmic ray shielding on the measured alpha-particle emissivity. A few atoms of radon contamination can cause elevated emissivities many days after exposure. © 1963-2012 IEEE.
Ethan H. Cannon, Daniel D. Reinhardt, et al.
IRPS 2004
Michael S. Gordon, Kenneth P. Rodbell, et al.
IEEE TNS
Ethan H. Cannon, Daniel D. Reinhardt, et al.
IRPS 2004
James R. Schwank, Marty R. Shaneyfelt, et al.
IEEE TNS