William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Employing k-resolved inverse-photoemission spectroscopy, we have measured the dispersion of the unoccupied electronic surface-state band of cleaved single-domain Si(111) 2×1 along the J and J symmetry directions. The energy dispersion and general shape of the measured surface-state band agree well with the calculated band of the -bonded chain model. © 1987 The American Physical Society.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
P.C. Pattnaik, D.M. Newns
Physical Review B
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
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Journal of Applied Mechanics, Transactions ASME