PaperEnergy and time-resolved photoemission in a promising new approach for contactless integrated-circuit testingH.K. Seitz, A. Blacha, et al.Microelectronic Engineering
PaperPicosecond photoemission probing of integrated circuits. Capabilities, limitations, and applicationsR. Clauberg, H. Beha, et al.IBM J. Res. Dev
PaperVoltage detector and sub-micrometer focusing unit for photoemission probingR. Clauberg, A. Blacha, et al.Review of Scientific Instruments
Conference paperPicosecond photoemission sampling for contactless high speed integrated circuit diagnosticsA. Blacha, R. Clauberg, et al.Advances in Semiconductors and Semiconductor Structures 1987
