R. Clauberg, H. Beha, et al.
IBM J. Res. Dev
Paper
VB-2 Laser-Induced Photoemission for Contactless High-Speed IC Testing
Abstract
No abstract available.
Related
H.K. Seitz, A. Blacha, et al.
European Test Conference 1989
A. Blacha, R. Clauberg, et al.
Advances in Semiconductors and Semiconductor Structures 1987
R. Clauberg, K.H. Frank, et al.
Surface Science